Olympus GX71 Inverted Microscope

Olympus GX71 inverted metallurgical microscope with high performance strain free optics offering 12.5 to 2000x magnifications.  The specification can be tailored to your requires for filters and lenses.  System can be offered with Preciv Image analysis system or alternative systems depending on requirement and budget.
The GX71 inverted microscope remains one of the most sought-after core research metallographs in use today. Capable of numerous image forming techniques with UIS2 objectives, the GX71 is the workhorse that will provide years of reliability.

  • Easy and Comfortable to Use with a Variety of Image Forming Techniques

    To handle the diversity of incoming samples and their unique analysis requirements the GX71 implements the largest variety of image forming techniques of all the Olympus inverted metallographs. Brightfield, darkfield, DIC, simple polarization, and fluorescence are available for spot-on investigations. Housed in a dust free turret a selection of mirror cubes can be conveniently and quickly rotated from one position to another.


    Built-In Magnification Changer

    Continuous zoom or selectable increments allow images to be viewed at higher magnifications for added inspection versatility and/or required test and inspection standards.


    GX71 Magnification Changer SwitchGX71 Zoom In/Out Function result example


    Super Widefield Observation

    Scan large areas for sample integrity, or defects and irregularities with the 26.5mm view-field offered with the GX-71 system.


    Enhanced Efficiency Through Motorization

    The use of motorized components can save time and cut costs when large quantities of samples require analysis. A single handset is available to quickly control the rotation of objectives. For higher levels of speed and analysis, Stream Image Analysis Software will manage additional components such as the motorized filter wheel and automated scanning stages.


    Variety of Choices for Superior Imaging Performance

    UIS2 optics delivers bright, sharp, high-resolution images suitable for all observation methods: brightfield, darkfield, differential interference contrast, polarization, and fluorescence. Designed with specific wave front aberration controls and specialty coatings for color fidelity, UIS2 optics ensure images are true to form and highly resolved.

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